半導(dǎo)體測試探針臺(tái):KUP007,EMP100C,EMP100B,EMP50S
特點(diǎn):
* x y z 15 mm-19mm-19mm
*分辨率:5微米
*線性運(yùn)動(dòng)

磁鐵底座/off-control(選項(xiàng))
探索傾向
提示夾螺絲

同軸刀頭固定螺釘
同軸端座管
三軸端固定螺釘
三軸端托管
(低泄漏電流<100fA)
射頻臂(W/E或N/S)

8寸雷射修補(bǔ)變溫(負(fù))探針量測系統(tǒng)

高溫高濕真空氣體照光Bending 可靠度量系統(tǒng):
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低成本探針臺(tái):
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4英寸探針臺(tái):

EMP100C EMP100B
C 型探針臺(tái) Model:EMP50S

測量解決方案系統(tǒng)

EMP100C 探針臺(tái)
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Semiconductor test probe station: KUP007, EMP100C, EMP100B, EMP50S
Features:
X, y, z 15 mm-19mm-19mm
* resolution :5 microns
* linear motion
Magnet base /off-control(option)
To explore the tendency
Cleat screw
Fixed screw with coaxial cutter head
Coaxial end seat tube
Triaxial end fixing screw
Triaxial end tube
(low leakage current <100fA)
Rf arm (W/E or N/S)