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美國(guó)耐諾Nanometrics
III-V族 化合物半導(dǎo)體制程控制 系統(tǒng)設(shè)備制造商,提供頂級(jí)設(shè)備檢測(cè),光電組件磊晶過程之雜值濃度縱向分布量測(cè)儀(ECV) 、數(shù)字深層瞬時(shí)光譜儀(DLTS) 、霍爾效應(yīng)量測(cè)完整系統(tǒng)(Hall system) 、光譜圖譜儀(PL) 、X射線衍射儀(x-ray) 、高速晶圓電阻系數(shù)分布圖量測(cè)系統(tǒng)

NANOMETRICS BRINGS YOU THE BROADEST ARRAY OF ADVANCED METROLOGIES IN THE INDUSTRY.主要產(chǎn)品
Nanometrics’ product lines offer an extensive array of proprietary technologies in optics, software and systems integration designed to meet the process control requirements of today’s advanced semiconductor technologies. These process control solutions are implemented on common metrology platforms that can be configured with a variety of measurement technologies, or as a single technology targeted for a specific process control application.